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X-ray photoelectron spectroscopy and Rutherford backscattering spectrometry study of anion incorporation in anodically grown films

✍ Scribed by N. Magnussen; L. Quinones; D.L. Cocke; E.A. Schweikert; B.K. Patnaik; C.V.Barros Leite; G.B. Baptista

No coin nor oath required. For personal study only.

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