✦ LIBER ✦
Auger electron spectroscopy depth profiling studies on stationary and rotated samples of a new model metal/semiconductor multilayer structure
✍ Scribed by A. Zalar; S. Hofmann; P. Panjan; V. Kraševec
- Publisher
- Elsevier Science
- Year
- 1992
- Tongue
- English
- Weight
- 940 KB
- Volume
- 220
- Category
- Article
- ISSN
- 0040-6090
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