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ZrO2as a high-K dielectric for strained SiGe MOS devices

โœ Scribed by R. Mahapatra; G. S. Kar; C. B. Samantaray; A. Dhar; D. Bhattacharya; S. K. Ray


Book ID
110646365
Publisher
Springer-Verlag
Year
2002
Tongue
English
Weight
48 KB
Volume
25
Category
Article
ISSN
0250-4707

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There has been a search for alternative dielectrics with significantly increased dielectric constants, K, which increases physical thickness in proportion to K, and therefore would significantly reduce direct tunneling. However, increases in K to values of 15-25 in transition metal and rare earth ox