Structural and optical properties of ZnO films grown on silicon and their applications in MOS devices in conjunction with ZrO2as a gate dielectric

✍ Scribed by S. K. Nandi; S. Chakraborty; M. K. Bera; C. K. Maiti

• Book ID: 107582021
• Publisher: Springer-Verlag
• Year: 2007
• Tongue: English
• Weight: 990 KB
• Volume: 30
• Category: Article
• ISSN: 0250-4707
• DOI: 10.1007/s12034-007-0044-3