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X-ray topography of epitaxially grown silicon layers

✍ Scribed by C. Szekely; L. Varga

Publisher: John Wiley and Sons
Year: 1970
Tongue: English
Weight: 259 KB
Volume: 5
Category: Article
ISSN: 0232-1300
DOI: 10.1002/crat.19700050114

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