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X-Ray Topography and Crystal Characterization || High-Resolution X-Ray Diffraction Analyses of Protein Crystals

✍ Scribed by H. M. Volz and R. J. Matyi


Book ID
123646390
Publisher
The Royal Society
Year
1999
Tongue
English
Weight
990 KB
Volume
357
Category
Article
ISSN
0264-3952

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Stereometrical X-ray Interferometric Dif
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## Stereometrical X-ray Interferometric Diffraction Topography of Crystal Imperfection A method for X-ray interferometric investigation of the deformation field of crystal imperfections by means of double and triple interferometers is proposed. It is shown experimentally that by means of double an