𝔖 Bobbio Scriptorium
✦   LIBER   ✦

High-resolution X-ray diffraction analyses of protein crystals

✍ Scribed by Volz, H. M.; Matyi, R. J.

Book ID
111947807
Publisher
The Royal Society
Year
1999
Tongue
English
Weight
254 KB
Volume
357
Category
Article
ISSN
0264-3952

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

High-resolution X-ray diffraction study
High-resolution X-ray diffraction study of CZ-grown GaAsP crystals
✍ Kowalski, G. ;Gronkowski, J. ;CzyzΜ‡ak, A. ;SΕ‚upiński, T. ;Borowski, J. πŸ“‚ Article πŸ“… 2007 πŸ› John Wiley and Sons 🌐 English βš– 354 KB

## Abstract We report results of X‐ray investigations of tellurium‐doped GaAs~1–__x__~ P~__x__~ (with 0.07 ≀ __x__ ≀ 0.20) single crystals, conducted in order to support finding proper growth parameters which would yield a material of sufficient homogeneity of the lattice parameter for prospective

High resolution X-ray diffraction analys
High resolution X-ray diffraction analyses of ion-implanted GaN/AlN/Si heterostructures
✍ Matyi, R. J. ;Jamil, M. ;Shahedipour-Sandvik, F. πŸ“‚ Article πŸ“… 2007 πŸ› John Wiley and Sons 🌐 English βš– 478 KB

## Abstract High resolution triple‐axis X‐ray diffraction has been used to characterize the effects of nitrogen ion implantation into thin (15 nm and 55 nm) AlN buffer layers on the resultant structural quality of nominally 2 ΞΌm epitaxial GaN layers grown on silicon substrates. The GaN symmetric (0