## Stereometrical X-ray Interferometric Diffraction Topography of Crystal Imperfection A method for X-ray interferometric investigation of the deformation field of crystal imperfections by means of double and triple interferometers is proposed. It is shown experimentally that by means of double an
β¦ LIBER β¦
X-Ray Diffraction Topography of Zinc Single Crystals
β Scribed by Chr. Nanev; M. Wilkens
- Publisher
- John Wiley and Sons
- Year
- 1969
- Tongue
- English
- Weight
- 457 KB
- Volume
- 32
- Category
- Article
- ISSN
- 0370-1972
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