✦ LIBER ✦

Stereometrical X-ray Interferometric Diffraction Topography of Crystal Imperfection

✍ Scribed by Professor A. O. Aboyan

Publisher: John Wiley and Sons
Year: 1996
Tongue: English
Weight: 908 KB
Volume: 31
Category: Article
ISSN: 0232-1300
DOI: 10.1002/crat.2170310417

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✦ Synopsis

Stereometrical X-ray Interferometric Diffraction Topography of Crystal Imperfection

A method for X-ray interferometric investigation of the deformation field of crystal imperfections by means of double and triple interferometers is proposed. It is shown experimentally that by means of double and triple interferometers it is possible to detect segregation lines, displacement lines, and the Moirk patterns of different type imperfections as well.

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