✦ LIBER ✦

X-Ray Topography and Crystal Characterization || High-Resolution Characterization of Microdefects by X-Ray Diffuse Scattering

✍ Scribed by Jerzy Gronkowski, Janusz Borowski and Elżbieta Zielińska-Rohozińska

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

X-Ray Topography and Crystal Characteriz

✍ H. M. Volz and R. J. Matyi 📂 Article 📅 1999 🏛 The Royal Society 🌐 English ⚖ 990 KB

Characterization of nearly perfect alkal

✍ Krishan Lal; Bhanu Pratap Singh 📂 Article 📅 1981 🏛 Elsevier Science 🌐 English ⚖ 614 KB

Study of microdefects in GaAs by X-ray d

✍ P. Franzosi 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 428 KB

X-Ray Topography and Crystal Characteriz

📂 Article 📅 1999 🏛 The Royal Society 🌐 English ⚖ 254 KB

Characterization of interface roughness

✍ T. Salditt; D. Lott; T.H. Metzger; J. Peisl; G. Vignaud; J.F. Legrand; G. Grübel 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 412 KB

X-ray scattering radiography and orienta

✍ Yoshinori Chikaura; Hideki Kii; Yoshifumi Suzuki 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 784 KB