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X-ray diffraction peak profiles from heteroepitaxial structures with misfit dislocations

✍ Scribed by V. M. Kaganer; R. Opitz; M. Schmidbauer; R. Köhler; B. Jenichen

Publisher
Italian Physical Society
Year
1997
Tongue
English
Weight
543 KB
Volume
19
Category
Article
ISSN
0392-6737

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