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X-Ray Diffraction from Multilayer Structures with Statistically Distributed Microdefects

✍ Scribed by Punegov, V. I.


Publisher
John Wiley and Sons
Year
1993
Tongue
English
Weight
561 KB
Volume
136
Category
Article
ISSN
0031-8965

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## Abstract The dynamical recurrence relation for amplitudes of coherent waves in the multilayered structure with Coulomb‐type defects (2D and 3D defects or microdefects) has been derived and the expression for the diffuse component of reflection coefficient of this structure has been obtained with