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Double crystal X-ray diffraction characterization of multilayer heteroepitaxial structures with submicron layers

โœ Scribed by Faleev, N. N. ;Flaks, L. I. ;Konnikov, S. G.

Publisher
John Wiley and Sons
Year
1989
Tongue
English
Weight
374 KB
Volume
113
Category
Article
ISSN
0031-8965

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