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X-Ray Diffraction Investigation of Si Crystals with Randomly Distributed Microdefects by the Inclination Method

✍ Scribed by Voronkov, S. N. ;Chukhovskii, F. N. ;Lomovtsev, P. V. ;Darbinyan, S. P.

Publisher: John Wiley and Sons
Year: 1992
Tongue: English
Weight: 800 KB
Volume: 134
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2211340202

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