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Investigation of Internal Stresses in Silicon Semiconductor Crystals in Constant Electric and Magnetic Fields by Means of the method of X-Ray Diffraction Moire

✍ Scribed by Arshakyan, E. Z. ;Aboyan, A. O.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

X-ray interferometric investigations of

✍ Arshakyan, E. Z. ;Aboyan, A. O. ;Bezirganyan, P. A. 📂 Article 📅 1988 🏛 John Wiley and Sons 🌐 English ⚖ 639 KB

Investigation of the tensor character of

✍ M. Hecker; E. Thiele; C. Holste 📂 Article 📅 2002 🏛 Elsevier Science 🌐 English ⚖ 227 KB