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Short range correlations of misfit dislocations in the X-ray diffraction peaks

โœ Scribed by Kaganer, Vladimir M. ;Sabelfeld, Karl K.

Publisher
John Wiley and Sons
Year
2011
Tongue
English
Weight
216 KB
Volume
208
Category
Article
ISSN
0031-8965

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โœฆ Synopsis

Abstract

The Xโ€ray diffraction peak profiles due to misfit dislocations are studied for the dislocations correlated on distances much smaller than the film thickness. Simple analytical expressions for the correlation parameter are obtained when the dislocations are generated as a Markov chain. Monte Carlo calculations show the peak profile evolution as order in the dislocation positions increases.

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โœ Kaganer, Vladimir M. ;Shalimov, Artem ;Bak-Misiuk, Jadwiga ;Ploog, Klaus H. ๐Ÿ“‚ Article ๐Ÿ“… 2007 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 453 KB

## Abstract We propose a common description of the full widths at half maximum of Xโ€ray diffraction peaks obtained in different scans of tripleโ€crystal diffractometry and as well as for glancing incidence and glancing exit doubleโ€crystal measurements. Calculations are compared with measurements of