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X-ray diffraction analysis of the defect structure in epitaxial GaN

✍ Scribed by Heinke, H.; Kirchner, V.; Einfeldt, S.; Hommel, D.

Book ID: 120054385
Publisher: American Institute of Physics
Year: 2000
Tongue: English
Weight: 52 KB
Volume: 77
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.1314877

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