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Defect structure analysis by X-Ray powder diffraction and luminescence

✍ Scribed by Wulff, H. ;Sasum, U. ;Limburg, H.-J.

Publisher: John Wiley and Sons
Year: 1992
Tongue: English
Weight: 296 KB
Volume: 130
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2211300235

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