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Variable energy positron beam characterization of defects in as-grown and annealed low temperature grown GaAs

✍ Scribed by M. T. Umlor; D. J. Keeble; P. W. Cooke; P. Asoka-Kumar; K. G. Lynn

Book ID: 112811718
Publisher: Springer US
Year: 1993
Tongue: English
Weight: 369 KB
Volume: 22
Category: Article
ISSN: 0361-5235
DOI: 10.1007/bf02649986

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