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Annealing-induced evolution of defects in low-temperature-grown GaAs-related materials

โœ Scribed by Zhang, M. H.; Guo, L. W.; Li, H. W.; Li, W.; Huang, Q.; Bao, C. L.; Zhou, J. M.; Liu, B. L.; Xu, Z. Y.; Zhang, Y. H.; Lu, L. W.


Book ID
118004505
Publisher
The American Physical Society
Year
2001
Tongue
English
Weight
97 KB
Volume
63
Category
Article
ISSN
1098-0121

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