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Defects in the GaAs and InGaAs layers grown by low-temperature molecular-beam epitaxy

✍ Scribed by L. G. Lavrentieva; M. D. Vilisova; I. A. Bobrovnikova; I. V. Ivonin; V. V. Preobrazhenskii; V. V. Chaldyshev


Publisher
Springer
Year
2006
Tongue
English
Weight
311 KB
Volume
49
Category
Article
ISSN
1573-9228

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