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Excess arsenic and point defects in GaAS grown by molecular beam epitaxy at low temperatures

✍ Scribed by L. G. Lavrent’eva; M. D. Vilisova; I. A. Bobrovnikova; S. E. Toropov; V. V. Preobrazhenskii; B. R. Semyagin; M. A. Putyato; V. V. Chaldyshev


Publisher
SP MAIK Nauka/Interperiodica
Year
2004
Tongue
English
Weight
449 KB
Volume
45
Category
Article
ISSN
0022-4766

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Point defects in III–V materials grown b
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The present understanding of the point defects in GaAs and InP grown by molecular beam epitaxy at low temperature (LT) is briefly reviewed. New results on vacancies and ion-type acceptors obtained by positron annihilation are given. Depending on the growth temperature, Ga vacancies or small vacancy