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Vacancy effects in transient diffusion of Sb induced by ion implantation of Si+ and As+ ions

โœ Scribed by Lulli, G.; Bianconi, M.; Solmi, S.; Napolitani, E.; Carnera, A.


Book ID
120324760
Publisher
American Institute of Physics
Year
2000
Tongue
English
Weight
343 KB
Volume
87
Category
Article
ISSN
0021-8979

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Ion implantation is one of the key processing steps in silicon integrated circuit technology. Some integrated circuits require up to 17 implantation steps and circuits are seldom processed with less than 10 implantation steps. Controlled doping at controlled depths is an essential feature of implant