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Use of Small Gate Voltage Pulses for the Extraction of the Interface Trap Densities in MOS Structures Using The Charge Pumping Technique

✍ Scribed by Lin, Eugène ;Moussy, Eric ;Bauza, Daniel

Book ID: 120653558
Publisher: Cambridge University Press
Year: 2002
Weight: 109 KB
Volume: 716
Category: Article
ISSN: 0272-9172
DOI: 10.1557/PROC-716-B7.3

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