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Universal stress-defect correlation at (100)semiconductor/oxide interfaces

✍ Scribed by Houssa, M.; Scarrozza, M.; Pourtois, G.; Afanas’ev, V. V.; Stesmans, A.

Book ID
120407100
Publisher
American Institute of Physics
Year
2011
Tongue
English
Weight
747 KB
Volume
98
Category
Article
ISSN
0003-6951

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