Deep level transient capacitance spectroscopy of defects at native oxide-GaAs interfaces of 〈111〉 and 〈100〉 orientations

✍ Scribed by A.M. Narsale; B.M. Arora

• Publisher: Elsevier Science
• Year: 1984
• Weight: 147 KB
• Volume: 143
• Category: Article
• ISSN: 0167-2584
• DOI: 10.1016/0167-2584(84)90634-0