Deep level transient capacitance spectroscopy of defects at native oxide-GaAs interfaces of 〈1̄1̄1̄〉 and 〈100〉 orientations

✍ Scribed by A.M. Narsale; B.M. Arora

• Book ID: 118985634
• Publisher: Elsevier Science
• Year: 1984
• Tongue: English
• Weight: 222 KB
• Volume: 143
• Category: Article
• ISSN: 0039-6028
• DOI: 10.1016/0039-6028(84)90541-7