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Uniformity of Optical Constants in Amorphous Ta2O5Thin Films as Measured by Spectroscopic Ellipsometry

✍ Scribed by V. A. Shvets; D. V. Gritsenko; V. Sh. Aliev; S. I. Chikichev*; S. V. Rykhlitskii


Book ID
111609468
Publisher
Springer
Year
2004
Tongue
English
Weight
363 KB
Volume
33
Category
Article
ISSN
1063-7397

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Optical Constants of Polycrystalline Cd1
✍ K. Prasada Rao; O. Md. Hussain; B. Srinivasulu Naidu; P. Jayarama Reddy πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 127 KB πŸ‘ 2 views

Spectroscopic ellipsometry has been used to determine the optical constants-complex dielectric constant (e\* = e 1 + e 2 ), refractive index (n), extinction coefficient (k), absorption coefficient (a) and normal incidence reflectivity (R)-of two-source vacuum-evaporated polycrystalline Cd 1 Γ€x Zn x