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Ultrasmall MOSFETs: the importance of the full Coulomb interaction on device characteristics

✍ Scribed by Gross, W.J.; Vasileska, D.; Ferry, D.K.

Book ID: 114538289
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 166 KB
Volume: 47
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.870556

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