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[IEEE International Technical Digest on Electron Devices Meeting - Washington, DC, USA (3-6 Dec. 1989)] International Technical Digest on Electron Devices Meeting - The effects of off-axis substrate orientation on MOSFET characteristics

✍ Scribed by Chung, J.; Chen, J.; Levi, M.; Ko, P.-K.; Hu, C.

Book ID: 121850578
Publisher: IEEE
Year: 1989
Weight: 553 KB
Category: Article
DOI: 10.1109/IEDM.1989.74360

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