๐”– Bobbio Scriptorium
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[IEEE International Technical Digest on Electron Devices Meeting - Washington, DC, USA (3-6 Dec. 1989)] International Technical Digest on Electron Devices Meeting - The effects of off-axis substrate orientation on MOSFET characteristics

โœ Scribed by Chung, J.; Chen, J.; Levi, M.; Ko, P.-K.; Hu, C.


Book ID
121850578
Publisher
IEEE
Year
1989
Weight
553 KB
Category
Article

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