✦ LIBER ✦

Transmission Electron Microscopy || Diffracted Beams

✍ Scribed by Williams, David B.; Carter, C. Barry

Book ID: 118241607
Publisher: Springer US
Year: 2009
Weight: 513 KB
Category: Article
ISBN: 0387765018
DOI: 10.1007/978-0-387-76501-3_13

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Applications of many beam systematic dif

Applications of many beam systematic diffraction contrast in high voltage transmission electron microscopy

✍ Chen, L. J. ;Thomas, G. 📂 Article 📅 1974 🏛 John Wiley and Sons 🌐 English ⚖ 790 KB

Reflection high-energy electron diffract

Reflection high-energy electron diffraction/transmission electron microscopy observation of growth of InAs on GaAs (110) by molecular beam epitaxy

✍ X. Zhang; D.W. Pashley; J.H. Neave; P.N. Fawcett; J. Zhang; B.A. Joyce 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 565 KB

Epitaxial stress study by large angle co

Epitaxial stress study by large angle convergent beam electron diffraction and high-resolution transmission electron microscopy Moiré fringe pattern

✍ F Pailloux; R.J Gaboriaud; C Champeaux; A Catherinot 📂 Article 📅 2000 🏛 Elsevier Science 🌐 English ⚖ 583 KB

Molecular beam epitaxial growth mechanis

Molecular beam epitaxial growth mechanism of ZnSe epilayers on (100) GaAs as determined by reflection high-energy electron diffraction, transmission electron microscopy and X-ray diffraction

✍ P. Ruppert; D. Hommel; T. Behr; H. Heinke; A. Waag; G. Landwehr 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 443 KB

Investigation of Defects and Polarity in

Investigation of Defects and Polarity in GaN Using Hot Wet Etching, Atomic Force and Transmission Electron Microscopy and Convergent Beam Electron Diffraction

✍ P. Visconti; D. Huang; M.A. Reshchikov; F. Yun; T. King; A.A. Baski; R. Cingolan 📂 Article 📅 2001 🏛 John Wiley and Sons 🌐 English ⚖ 153 KB 👁 2 views

Synchrotron white beam X-ray topography,

Synchrotron white beam X-ray topography, transmission electron microscopy and high-resolution X-ray diffraction studies of defects and strain relaxation processes in wide band gap semiconductor crystals and thin films

✍ M. Dudley; J. Bai; X. Huang; W.M. Vetter; G. Dhanaraj; B. Raghothamachar 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 677 KB