Investigation of Defects and Polarity in GaN Using Hot Wet Etching, Atomic Force and Transmission Electron Microscopy and Convergent Beam Electron Diffraction

✍ Scribed by P. Visconti; D. Huang; M.A. Reshchikov; F. Yun; T. King; A.A. Baski; R. Cingolani; C.W. Litton; J. Jasinski; Z. Liliental-Weber; H. Morkoç

• Publisher: John Wiley and Sons
• Year: 2001
• Tongue: English
• Weight: 153 KB
• Volume: 228
• Category: Article
• ISSN: 0370-1972
• DOI: 10.1002/1521-3951(200111)228:2<513::aid-pssb513>3.0.co;2-y