Epitaxial stress study by large angle convergent beam electron diffraction and high-resolution transmission electron microscopy Moiré fringe pattern

✍ Scribed by F Pailloux; R.J Gaboriaud; C Champeaux; A Catherinot

• Book ID: 108466863
• Publisher: Elsevier Science
• Year: 2000
• Tongue: English
• Weight: 583 KB
• Volume: 288
• Category: Article
• ISSN: 0921-5093
• DOI: 10.1016/s0921-5093(00)00858-3