Synchrotron white beam X-ray topography, transmission electron microscopy and high-resolution X-ray diffraction studies of defects and strain relaxation processes in wide band gap semiconductor crystals and thin films

✍ Scribed by M. Dudley; J. Bai; X. Huang; W.M. Vetter; G. Dhanaraj; B. Raghothamachar

• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 677 KB
• Volume: 9
• Category: Article
• ISSN: 1369-8001
• DOI: 10.1016/j.mssp.2006.01.026