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Transimpedance amplifier-based full low-frequency noise characterization setup for Si/SiGe HBTs

✍ Scribed by Bary, L.; Borgarino, M.; Plana, R.; Parra, T.; Kovacic, S.J.; Lafontaine, H.; Graffeuil, J.

No coin nor oath required. For personal study only.

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