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The correlation resistance for low-frequency noise compact modeling of Si/SiGe HBTs

✍ Scribed by Borgarino, M.; Bary, L.; Vescovi, D.; Menozzi, R.; Monroy, A.; Laurens, M.; Plana, R.; Fantini, F.; Graffeuil, J.

No coin nor oath required. For personal study only.

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