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Modeling and characterization of SiGe HBT low-frequency noise figures-of-merit for RFIC applications

✍ Scribed by Jin Tang; Guofu Niu; Zhenrong Jin; Cressler, J.D.; Shiming Zhang; Joseph, A.J.; Harame, D.L.

Book ID: 114659687
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 527 KB
Volume: 50
Category: Article
ISSN: 0018-9480
DOI: 10.1109/tmtt.2002.804519

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