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Investigation of compact models for RF noise in SiGe HBTs by hydrodynamic device simulation

✍ Scribed by Jungemann, C.; Neinhus, B.; Meinerzhagen, B.; Dutton, R.W.

Book ID: 114617449
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 276 KB
Volume: 51
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2004.828277

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