✦ LIBER ✦
Impact Ionization Noise in SiGe HBTs: Comparison of Device and Compact Modeling With Experimental Results
✍ Scribed by Sakalas, P.; Ramonas, M.; Schroter, M.; Jungemann, C.; Shimukovitch, A.; Kraus, W.
- Book ID
- 114619294
- Publisher
- IEEE
- Year
- 2009
- Tongue
- English
- Weight
- 373 KB
- Volume
- 56
- Category
- Article
- ISSN
- 0018-9383
No coin nor oath required. For personal study only.