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Measurement of low-frequency base and collector current noise and coherence in SiGe heterojunction bipolar transistors using transimpedance amplifiers

โœ Scribed by Bruce, S.P.O.; Vandamme, L.K.J.; Rydberg, A.


Book ID
114537718
Publisher
IEEE
Year
1999
Tongue
English
Weight
310 KB
Volume
46
Category
Article
ISSN
0018-9383

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