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Frequency and bias-dependent modeling of correlated base and collector current RF noise in SiGe HBTs using quasi-static equivalent circuit

โœ Scribed by Kejun Xia; Guofu Niu; Sheridan, D.C.; Sweeney, S.L.


Book ID
114618118
Publisher
IEEE
Year
2006
Tongue
English
Weight
538 KB
Volume
53
Category
Article
ISSN
0018-9383

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