Improved correlation measurements using voltage and transimpedance amplifiers in low-frequency noise characterization of bipolar transistors

✍ Scribed by Bruce, S.; Vandamme, L.K.J.; Rydberg, A.

• Book ID: 114538281
• Publisher: IEEE
• Year: 2000
• Tongue: English
• Weight: 253 KB
• Volume: 47
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.861592