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Tracing the Ti-silicide formation by in situ ellipsometric measurements

โœ Scribed by T. Stark; F. Hergert; L. Ley


Book ID
104420693
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
394 KB
Volume
6
Category
Article
ISSN
1369-8001

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Ti-silicide formation during isochronal
โœ T. Stark; L. Gutowski; M. Herden; H. Grรผnleitner; S. Kรถhler; M. Hundhausen; L. L ๐Ÿ“‚ Article ๐Ÿ“… 2001 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 814 KB

Single-wavelength ellipsometry is employed to monitor in situ the reaction of titanium layers of different thickness (10-80 nm) with Si(100) to form titanium silicides during heating at constant rates up to 100 K / min. Previous studies performed on the platinum / silicon system showed that by the u