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In situ X-ray diffraction measurements of silicide formation in the CoSi system

✍ Scribed by S Zalkind; Joshua Pellag; L Zevin; B.M Ditchek

Book ID: 107864625
Publisher: Elsevier Science
Year: 1994
Tongue: English
Weight: 690 KB
Volume: 249
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(94)90759-5

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