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Measurements of interdiffusion in compositionally modulated amorphous Ni/Si multilayers by in situ X-ray diffraction

✍ Scribed by W.H. Wang; H.Y. Bai; H. Chen; Y. Zhang; W.K. Wang

Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
534 KB
Volume
22
Category
Article
ISSN
0921-5107

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