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X-ray diffraction study of amorphization along interfaces in polycrystalline Ni/Ti multilayers

✍ Scribed by M. Bouhki; A. Bruson; P. Guilmin

Publisher: Elsevier Science
Year: 1992
Tongue: English
Weight: 302 KB
Volume: 83
Category: Article
ISSN: 0038-1098
DOI: 10.1016/0038-1098(92)90003-r

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