A computer controlled X-ray diffraction system utilizing position sensitive photon counting techniques that is capable of investigating, in situ, structure at the solid/liquid interface, particularly that between an electrode and an electrolyte solution, is described. The application of this techniq
β¦ LIBER β¦
In-situ X-ray diffraction studies of Pt electrode/solution interfaces
β Scribed by M. Fleischmann; B.W. Mao
- Publisher
- Elsevier Science
- Year
- 1987
- Weight
- 973 KB
- Volume
- 229
- Category
- Article
- ISSN
- 0022-0728
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