A computer controlled X-ray diffraction system utilizing position sensitive photon counting techniques that is capable of investigating, in situ, structure at the solid/liquid interface, particularly that between an electrode and an electrolyte solution, is described. The application of this techniq
Specular X-ray reflection for the “in situ” study of electrode surfaces
✍ Scribed by C.A. Melendres; H. You; V.A. Maroni; Z. Nagy; W. Yun
- Publisher
- Elsevier Science
- Year
- 1991
- Weight
- 393 KB
- Volume
- 297
- Category
- Article
- ISSN
- 0022-0728
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