✦ LIBER ✦
Combination of specular and off-specular low-angle x-ray diffraction in the study of Co/Cu multilayers: mesoscopic structure and layer oxidation
✍ Scribed by de Bernabé, A.; Capitán, M. J.; Fischer, H. E.; Quirós, C.; Prieto, C.; Colino, J.; Mompeán, F.; Sanz, J. M.
- Publisher
- John Wiley and Sons
- Year
- 1999
- Tongue
- English
- Weight
- 175 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0142-2421
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✦ Synopsis
The use of resonant low-angle x-ray di †raction, combining specular and o †-specular scans, has been used to characterize accurately and self-consistently a set of magnetron-sputtered Co/Cu multilayers. This study has permitted their mesoscopic structure and quality of interfaces to be determined. Moreover, it has been observed that oxidation of the outer Co layer stops at the Co/Cu interface, whence no Cu oxide is produced. The cause of this is explained by the di †erence in the Fermi energies between Co and Cu.