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Towards quantitative depth profiling with high spatial and high depth resolution

✍ Scribed by N. Vanhove; P. Lievens; W. Vandervorst


Book ID
108060621
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
652 KB
Volume
255
Category
Article
ISSN
0169-4332

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The ion-bombardment-induced defects and their effect on the capability of Auger depth profiling is reviewed and discussed. It is shown that by using low ion energy ( Ͻ 1 keV) and grazing angle of incidence ( Ͼ 80Њ), the quasi-quantitative detection of layers with thickness of 1 nm can be acheived. W